Test patterns generated by the SCE. There are four different options. COLUMNS: Each column has a constant value. Value per channel increments from 1 to 258 across detector frame. ROWS: Each row has a constant value. Value increments from 1 to 1024 up the detector frame. FRAMES: All pixels in a frame have a value corresponding to the countdown from the number of frames (e.g. all pixels in the first frame of a 10 frames commanded exposure will have the value 10). ALL: Detector channel 1: column count. Channel 2: row count. Channel 3: frame count. Channel 4: Intregration count. Reference output values are zero.
| Attribute | Value |
|---|---|
| data type | string |
| enumerated Values | ['COLUMNS', 'ROWS', 'FRAMES', 'ALL'] |
| units | |
| example | ALL |
| default value | ALL |
| special processing | |
| source | Engineering Service |
| software source | |
| calculation | Engineering value MIR_XX_CMD_TESTSEL, where XX is detector: IC for MIRIMAGE, LW for MIRIFULONG, SW for MIRIFUSHORT |
| DB destination | ['MiriScience.cmd_tsel'] |
| data type in DB | nvarchar(10) |
| instrument | MIRI |
| mode | MIR_DARK |
| product level | 1B |
| FITS hdu | PRIMARY |
| FITS header section |