List of Figures

•   LWP small-aperture high-dispersion (even orders) format.
•   LWP small-aperture high-dispersion (odd orders) format.
•   LWP large-aperture high-dispersion (even orders) format.
•   LWP large-aperture high-dispersion (odd orders) format.
•   LWP large- and small-aperture low-dispersion format.
•   LWR small-aperture high-dispersion (even orders) format.
•   LWR small-aperture high-dispersion (odd orders) format.
•   LWR large-aperture high-dispersion (even orders) format.
•   LWR large-aperture high-dispersion (odd orders) format.
•   LWR large- and small-aperture low-dispersion format.
•   SWP small-aperture high-dispersion (even orders) format.
•   SWP small-aperture high-dispersion (odd orders) format.
•   SWP large-aperture high-dispersion (even orders) format.
•   SWP large-aperture high-dispersion (odd orders) format.
•   SWP large- and small-aperture low-dispersion format.
•   LWP Geometry
•   LWR Geometry
•   SWP Geometry
•   Low-dispersion spectral resolution.
•   Low-dispersion spatial resolution.
•   LWP high-dispersion spectral resolution from WAVECAL analysis.
•   LWR high-dispersion spectral resolution from WAVECAL analysis.
•   SWP high-dispersion spectral resolution from WAVECAL analysis.
•   LWP high-dispersion spectral resolution from analysis of large-aperture Zeta Oph data.
•   SWP high-dispersion spectral resolution from analysis of large- and small-aperture Zeta Oph data. Small-aperture data is horizontally offset to the left of the large-aperture data by half an order.
•   SWP high-dispersion spectral resolution from large-aperture stellar source analysis. Absorption line data is horizontally offset to the left of the emission line data by half an order.
•   SWP high-dispersion spectral resolution from small-aperture stellar source analysis. Absorption line data is horizontally offset to the left of the emission line data by half an order.
•   LWP high-dispersion spatial resolution for sample position 134. Small-aperture data is horizontally offset to the left of the large-aperture data by half an order.
•   LWP high-dispersion spatial resolution for sample position 258. Small-aperture data is horizontally offset to the left of the large-aperture data by half an order.
•   LWP high-dispersion spatial resolution for sample position 384. Small-aperture data is horizontally offset to the left of the large-aperture data by half an order.
•   LWP high-dispersion spatial resolution for sample position 507. Small-aperture data is horizontally offset to the left of the large-aperture data by half an order.
•   LWP high-dispersion spatial resolution for sample position 615. Small-aperture data is horizontally offset to the left of the large-aperture data by half an order.
•   LWR high-dispersion spatial resolution for sample position 134. Small-aperture data is horizontally offset to the left of the large-aperture data by half an order.
•   LWR high-dispersion spatial resolution for sample position 258. Small-aperture data is horizontally offset to the left of the large-aperture data by half an order.
•   LWR high-dispersion spatial resolution for sample position 384. Small-aperture data is horizontally offset to the left of the large-aperture data by half an order.
•   LWR high-dispersion spatial resolution for sample position 507. Small-aperture data is horizontally offset to the left of the large-aperture data by half an order.
•   LWR high-dispersion spatial resolution for sample position 615. Small-aperture data is horizontally offset to the left of the large-aperture data by half an order.
•   SWP high-dispersion spatial resolution for sample position 134. Small-aperture data is horizontally offset to the left of the large-aperture data by half an order.
•   SWP high-dispersion spatial resolution for sample position 258. Small-aperture data is horizontally offset to the left of the large-aperture data by half an order.
•   SWP high-dispersion spatial resolution for sample position 384. Small-aperture data is horizontally offset to the left of the large-aperture data by half an order.
•   SWP high-dispersion spatial resolution for sample position 507. Small-aperture data is horizontally offset to the left of the large-aperture data by half an order.
•   SWP high-dispersion spatial resolution for sample position 615. Small-aperture data is horizontally offset to the left of the large-aperture data by half an order.
•   (a) Displacements computed between an SWP low-dispersion image and the SWP ITF. (b) Magnitude of the correlation coefficients corresponding to the results shown in Panel a.
•   (a) Displacements computed between an SWP high-dispersion image and the SWP ITF. (b) Magnitude of the correlation coefficients corresponding to the results shown in Panel a.
•   White Dwarf SWP spectra showing the 1515Å artifact.
•   Low-dispersion wavelength linearization correction vectors.
•   Spectrum centroid location in LWP low-dispersion SI data.
•   Spectrum centroid location in LWR low-dispersion SI data.
•   Spectrum centroid location in ``dewiggled'' LWP low-dispersion SI data.
•   Spectrum centroid location in ``dewiggled'' LWR low-dispersion SI data.
•   Geometry of the spectrograph apertures as they appear in the low-dispersion SI.
•   Short and long wavelength low-dispersion WAVECAL spectra. Pt-Ne features included in the low-dispersion line libraries are marked.
•   Low-dispersion time and temperature correlations with wavelength and spatial zeropoints for the LWP camera.
•   Low-dispersion time and temperature correlations with wavelength and spatial zeropoints for the LWR camera (ITF A).
•   Low-dispersion time and temperature correlations with wavelength and spatial zeropoints for the LWR camera (ITF B).
•   Low-dispersion time and temperature correlations with wavelength and spatial zeropoints for the SWP camera.
•   Locations of the extraction and background fitting regions within the low-dispersion SI.
•    Layout of the background extraction swaths on a sample SWP high-dispersion image. Lines running in the vertical (spatial) direction are the Pass 1 extractions. The reconstructed background solutions created in Pass 2 are placed in the positions of the echelle orders (horizontal lines).
•    Crosscut of background fluxes from a central ``Pass 1'' swath through an SWP image. Stellar fluxes are off-scale in this diagram. The triangular area describes the local raw background fluxes in the Interorder-Overlap Region where order crowding is severe; the halation region is shown to the right. Small crosses denote the raw fluxes corrected for overlap by the PSF model. The solid line is the Pass 1 solution, a Chebyshev, degree-7 polynomial.
•    Final background solution for SWP20931, Order 95 (smooth solid line). The comb structure connected to the solution reflects the solutions for the various Pass 1 swaths sampled at the line position of this order.
•    Layout of the background extraction swaths on a sample SWP high-dispersion image. Lines running in vertical (spatial) direction are the Pass 1 extractions. Raw fluxes are sampled along these lines that are within the target ring and outside or between the echelle orders. The reconstructed background solutions created in Pass 2 are placed in the positions of the echelle orders (horizontal lines).
•    Crosscut of background fluxes from a central ``Pass 1" swath through an SWP image. Stellar fluxes are off-scale in this diagram. The triangular area describes the local raw background fluxes in the Interorder-Overlap Region where order crowding is severe; the halation region is shown to the right. Small crosses denote the raw fluxes corrected for overlap by the PSF model. The solid line is the Pass 1 solution, a Chebyshev, degree-7 polynomial.
•    A depiction of the influence of interorder overlap in progressively raising the intensity of (unit height) orders towards shorter wavelengths (left). The dashed lines represent intensities the orders would have if there were no overlap.
•    Final background solution for SWP20931, order 95 (smooth solid line). The comb structure connected to the solution reflects the solutions for the various Pass 1 swaths sampled at the line position of this order.

1 Introduction